<?xml version="1.0" encoding="utf-8" standalone="yes"?><rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>multiobjective deep reinforcement learning | 电子与技术硕士</title><link>https://mscest.cut.ac.cy/zh/tag/multiobjective-deep-reinforcement-learning/</link><atom:link href="https://mscest.cut.ac.cy/zh/tag/multiobjective-deep-reinforcement-learning/index.xml" rel="self" type="application/rss+xml"/><description>multiobjective deep reinforcement learning</description><generator>Wowchemy (https://wowchemy.com)</generator><language>zh-Hans</language><lastBuildDate>Wed, 01 Jan 2025 00:00:00 +0000</lastBuildDate><image><url>https://mscest.cut.ac.cy/media/logo_hude1662fe81542519856cdd9b507606f3_856625_300x300_fit_lanczos_3.png</url><title>multiobjective deep reinforcement learning</title><link>https://mscest.cut.ac.cy/zh/tag/multiobjective-deep-reinforcement-learning/</link></image><item><title>Multiobjective Deep Reinforcement Learning Driven Collaborative Optimization of TSV-Based Microchannel and PDN for 3-D ICs</title><link>https://mscest.cut.ac.cy/zh/publication/2025jfengc/</link><pubDate>Wed, 01 Jan 2025 00:00:00 +0000</pubDate><guid>https://mscest.cut.ac.cy/zh/publication/2025jfengc/</guid><description>&lt;p>This study introduces a multiobjective deep reinforcement learning (MODRL) framework for the concurrent thermal-hydraulic optimization of the through-silicon-via (TSV) microchannel heat sink (MCHS) embedded in 3-D integrated circuits (3-D ICs) power delivery network (PDN). By exploiting the inherent structural synergy between TSVs and pin-fin MCHS, the proposed method enhances thermal management in high-density 3-D ICs. The framework integrates deep reinforcement learning (RL) with multiobjective optimization and computational fluid dynamics (CFD) simulations, enabling an efficient exploration of the high-dimensional design space to resolve tradeoffs between thermal efficacy and fluidic resistance. Relative to baseline, the optimized design achieves a reduction in maximum chip temperature of up to 3.3% while concurrently lowering the overall pressure drop by 17.2%. Impedance analysis further validates the design&amp;rsquo;s superiority, showing that the optimized TSV geometry effectively suppresses high-frequency peak impedance. Compared with standard deep reinforcement learning (SDRL) and genetic algorithm (GA), MODRL converges faster by 57.1% and 62.5%, respectively, showing stronger convergence. These results highlight the advantages of the MODRL intelligent optimization framework in design speed and its great potential in driving the development of next-generation 3-D integrated circuits, especially in applications requiring high power density and high reliability.&lt;/p></description></item></channel></rss>